Porosity in Silicon and Silica Thin Films Monitored by Positrons and Positronium
Journal Article
(2004)
Author(s)
A van Veen (TU Delft - Old - Section Defects in Materials)
R Escobar Galindo (TU Delft - Old - Section Defects in Materials)
Stephan W H Eijt (TU Delft - Old - Section Defects in Materials)
H. Schut (TU Delft - Old - Section Defects in Materials)
H van Gog (External organisation)
AR Balkenende (External organisation)
Femke K. de Theije (External organisation)
Research Group
Old - Section Defects in Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:b96edef1-cd43-4e98-992b-f2f051aa3870
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Publication Year
2004
Research Group
Old - Section Defects in Materials
Volume number
445-446
Pages (from-to)
254-258
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