Porosity in Silicon and Silica Thin Films Monitored by Positrons and Positronium

van Veen, A; Escobar Galindo, R; Eijt, Stephan W. H.; Schut, H; van Gog, H; Balkenende, AR; de Theije, F.K.

Porosity in Silicon and Silica Thin Films Monitored by Positrons and Positronium

Journal article (2004)

Authors

A van Veen Old - Section Defects in Materials

R Escobar Galindo Old - Section Defects in Materials

Stephan W. H. Eijt Old - Section Defects in Materials

H Schut Old - Section Defects in Materials

H van Gog External organisation

AR Balkenende External organisation

F.K. de Theije External organisation

Research Group

Old - Section Defects in Materials

To reference this document use:

http://resolver.tudelft.nl/uuid:b96edef1-cd43-4e98-992b-f2f051aa3870

More Info

expand_more

Published Date

2004

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

Old - Section Defects in Materials

No files available

Metadata only record. There are no files for this journal article.