Total ionizing effects on 4-transistor CMOS image sensor pixels
Conference Paper
(2010)
Author(s)
J Tan (TU Delft - Electronic Instrumentation)
Albert Theuwissen (TU Delft - Electronic Instrumentation)
Research Group
Electronic Instrumentation
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https://resolver.tudelft.nl/uuid:399547f9-9880-4c10-9cee-9fb3811690b8
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Publication Year
2010
Language
English
Research Group
Electronic Instrumentation
Pages (from-to)
1-4
ISBN (print)
978-1-4244-9998-4
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