Moisture Effects on a System in Package Carrier

Conference Paper (2009)
Authors

X. Ma (TU Delft - Computational Design and Mechanics)

Kaspar M B Jansen (TU Delft - Computational Design and Mechanics)

LJ Ernst (TU Delft - Computational Design and Mechanics)

Willem Dirk van van Driel (TU Delft - Computational Design and Mechanics, TU Delft - Dynamics of Micro and Nano Systems)

O van der Sluis (TU Delft - Computational Design and Mechanics)

GQ Zhang (External organisation)

Research Group
Computational Design and Mechanics
More Info
expand_more
Publication Year
2009
Research Group
Computational Design and Mechanics
Pages (from-to)
379-383
ISBN (print)
978-1-4244-4159-4

Abstract

Moisture induced failures in the plastic encapsulated packages are one of the most important failure mechanisms in microelectronics. These failures are driven by the mismatch between different material properties, such as CTA, CME (Coefficient of Moisture induced Expansion) and degradation of interface strength caused by moisture absorption of polymer materials. Therefore, it is critical to know how much moisture exists in packaging materials, the moisture distribution in the package and hygro-mechanical effects on the package. In this paper moisture diffusion, moisture distribution and hygro-mechanical effects are simulated at the following conditions: 85°C/85%RH, 60°C/60%RH and 85°C/dry, 60°C/dry using 2D SiP (System in Package) finite element model.

No files available

Metadata only record. There are no files for this record.