2D simulation of hot-carrier-induced degradation and reliability analysis for single grain Si TFTs
Conference Paper
(2008)
Author(s)
J Tan (TU Delft - Electronic Instrumentation)
A Baiano (TU Delft - Electronic Components, Technology and Materials)
Ryoichi Ishihara (TU Delft - Electronic Components, Technology and Materials)
Kees Beenakker (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Instrumentation
To reference this document use:
https://resolver.tudelft.nl/uuid:3ff3da72-3696-4987-a52d-d13440fb6e99
More Info
expand_more
expand_more
Publication Year
2008
Research Group
Electronic Instrumentation
Pages (from-to)
600-603
ISBN (print)
978-90-73461-56-7
No files available
Metadata only record. There are no files for this record.