Low-power die-level process variation and temperature monitors for yield analysis and optimization in deep-submicron CMOS

Zjajo, A.; Barragan, M.J.; Pineda de Gyvez, J

Low-power die-level process variation and temperature monitors for yield analysis and optimization in deep-submicron CMOS

Journal article (2012)

Authors

A. Zjajo Signal Processing Systems

M.J. Barragan External organisation

J Pineda de Gyvez External organisation

Research Group

Signal Processing Systems

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Published Date

2012

Language

English

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Research Group

Signal Processing Systems

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