X-Ray Micro Tomography and image analysis as complementary methods for morphological characterization and coating thickness measurement of coated particles
Journal Article
(2010)
Author(s)
G. Perfetti (TU Delft - OLD ChemE/NanoStructured Materials)
E Casteele (External organisation)
Bernd Rieger (TU Delft - ImPhys/Quantitative Imaging)
w.j. wildeboer (External organisation)
G.M.H. Meesters (TU Delft - OLD ChemE/NanoStructured Materials)
Research Group
OLD ChemE/NanoStructured Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:414f2b52-b690-4543-a990-5faa90c75a17
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Publication Year
2010
Language
English
Research Group
OLD ChemE/NanoStructured Materials
Volume number
21
Pages (from-to)
663-675
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