Analyzing the radiation degradation of 4-transistor deep submicron technology CMOS image sensors
Journal Article
(2012)
Author(s)
J. Tan (TU Delft - Electronic Instrumentation)
B Buttgen (TU Delft - Electronic Instrumentation)
Albert Theuwissen (TU Delft - Electronic Instrumentation)
Research Group
Electronic Instrumentation
DOI related publication
https://doi.org/10.1109/JSEN.2012.2186287
To reference this document use:
https://resolver.tudelft.nl/uuid:437cc640-9866-4604-917e-9f58c1babf9f
More Info
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Publication Year
2012
Language
English
Research Group
Electronic Instrumentation
Issue number
6
Volume number
12
Pages (from-to)
2278-2286
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