Advanced Terahertz electric near-flied measurements at sub-wavelenght diameter metallic apertures.

Adam, A. J.L.; Brok, JM; Seo, M.A.; Ahn, K.J.; Kim, D. S.; Kang, JH; Park, Q-H.; Nagel, M.; Planken, P.C.M.

Advanced Terahertz electric near-flied measurements at sub-wavelenght diameter metallic apertures.

Journal article (2008)

Authors

A. J.L. Adam ImPhys/Optics

JM Brok ImPhys/Optics

M.A. Seo External organisation

K.J. Ahn External organisation

D. S. Kim External organisation

JH Kang External organisation

Q-H. Park External organisation

M. Nagel External organisation

P.C.M. Planken ImPhys/Optics

Research Group

ImPhys/Optics

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Published Date

2008

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Research Group

ImPhys/Optics

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