Depth-dependent scaling of axial distances in light microscopy
S. Loginov (TU Delft - ImPhys/Hoogenboom group)
D.B. Boltje (TU Delft - ImPhys/Hoogenboom group, Delmic BV)
M. N.F. Hensgens (TU Delft - ImPhys/Geertsema group)
Jacob P. Hoogenboom (TU Delft - ImPhys/Hoogenboom group)
Ernest B. van der van der Wee (TU Delft - ImPhys/Hoogenboom group)
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Abstract
In volume fluorescence microscopy, refractive index matching is essential to minimize aberrations. There are, however, common imaging scenarios where a refractive index mismatch (RIM) between immersion and a sample medium cannot be avoided. This RIM leads to an axial deformation in the acquired image data. Over the years, different axial scaling factors have been proposed to correct for this deformation. While some reports have suggested a depth-dependent axial deformation, so far none of the scaling theories has accounted for a depth-dependent, non-linear scaling. Here, we derive an analytical theory based on determining the leading constructive interference band in the objective lens pupil under RIM. We then use this to calculate a depth-dependent re-scaling factor as a function of the numerical aperture (NA), the refractive indices n1 and n2, and the wavelength λ. We compare our theoretical results with wave-optics calculations and experimental results obtained using a measurement scheme for different values of NA and RIM. As a benchmark, we recorded multiple datasets in different RIM conditions, and corrected these using our depth-dependent axial scaling theory. Finally, we present an online web applet that visualizes the depth-dependent axial re-scaling for specific optical setups. In addition, we provide software that will help microscopists to correctly re-scale the axial dimension in their imaging data when working under RIM.