Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Process
C Veerappan (TU Delft - Signal Processing Systems)
J Richardson (External organisation)
R Walker (External organisation)
DU Li (External organisation)
M.W. Fishburn (TU Delft - Signal Processing Systems)
D Stoppa (External organisation)
F Borgetti (External organisation)
Y.. Kumamoto (TU Delft - Signal Processing Systems)
MA Gersbach (TU Delft - Microelectronics)
RK Henderson (External organisation)
C Bruschini (External organisation)
Edoardo Charbon-Iwasaki-Charbon (TU Delft - Signal Processing Systems)
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