Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Process

Conference Paper (2011)
Author(s)

C Veerappan (TU Delft - Signal Processing Systems)

J Richardson (External organisation)

R Walker (External organisation)

DU Li (External organisation)

M.W. Fishburn (TU Delft - Signal Processing Systems)

D Stoppa (External organisation)

F Borgetti (External organisation)

Y.. Kumamoto (TU Delft - Signal Processing Systems)

MA Gersbach (TU Delft - Microelectronics)

RK Henderson (External organisation)

C Bruschini (External organisation)

Edoardo Charbon-Iwasaki-Charbon (TU Delft - Signal Processing Systems)

Research Group
Signal Processing Systems
DOI related publication
https://doi.org/10.1109/ESSDERC.2011.6044167
More Info
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Publication Year
2011
Language
English
Research Group
Signal Processing Systems
Pages (from-to)
331-334
ISBN (print)
978-1-4577-0705-6

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