Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Process

Conference paper (2011)

Authors

C. Veerappan Signal Processing Systems - EEMCS
J Richardson External organisation
Claudio Bruschini External organisation
E. Charbon-Iwasaki-Charbon Signal Processing Systems - EEMCS
R Walker External organisation
DU Li External organisation
M.W. Fishburn Signal Processing Systems - EEMCS
D Stoppa External organisation
F Borgetti External organisation
Y.. Maruyama Signal Processing Systems - EEMCS
MA Gersbach Microelectronics
RK Henderson External organisation
Research Group
Signal Processing Systems (EEMCS) (TU Delft)
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Published Date

2011

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Signal Processing Systems