Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Process

C Veerappan (TU Delft - Signal Processing Systems)

J Richardson (External organisation)

R Walker (External organisation)

DU Li (External organisation)

M.W. Fishburn (TU Delft - Signal Processing Systems)

D Stoppa (External organisation)

F Borgetti (External organisation)

Y.. Kumamoto (TU Delft - Signal Processing Systems)

MA Gersbach (TU Delft - Microelectronics)

RK Henderson (External organisation)

C Bruschini (External organisation)

Edoardo Charbon-Iwasaki-Charbon (TU Delft - Signal Processing Systems)