Laboratory spectroscopic ellipsometer for bidirectional reflectance of planetary surfaces
A.A. Miles (Student TU Delft)
S.J.M. Dr Potin (TU Delft - Spaceborne Instrumentation)
J.J.D. Loicq (Université de Liège, TU Delft - Spaceborne Instrumentation)
P. Piron (TU Delft - Spaceborne Instrumentation)
F. Schmutz (TU Delft - Spaceborne Instrumentation)
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Abstract
Reflectance spectroscopy is a technique widely used to investigate the composition and physical properties of a surface. The spectro-polarimetry adds the investigation of the polarimetric state of the light, while keeping the spectroscopy dependency. This technique is currently limited for the characterization of the surface, but can bring another clue on the composition and physical properties of the studied surface. We present here the design of a novel ellipsometer, optimized for the investigation of the polarization state of the light reflected by a granular surface. This instrument is able to measure the linear and circular components of the polarization over a wide spectral range from the ultraviolet to near-infrared and at a wide choice of geometrical configuration. The wide spectral range is achieved with the use of a photoelastic modulator acting like a retardance waveplate over the whole working range. Spectro-polarimetric investigations of terrestrial and extra-terrestrial samples will have application to mineralogical investigations, planetary surface explorations, and improve our understanding of the Solar System.
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