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F. Schmutz
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2 records found
1
Conference paper
(2024)
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B.V. Mr. Vasilescu, P. Piron, F. Schmutz, Ralph Snel, Eugenio Iorio Di Iorio, Mireille Ouellet, Quentin Chavet, Ivan Ferrario, J.J.D. Loicq
During the last few years, one of our main research topics has been developing a new type of spectropolarimeter intended for space applications. Initially analyzed numerically, the instrument has a compact, stable design without rotating components. The entire Stokes vector can be determined in a single shot in a vast spectral range. The simulations proved that the modulation schemes that can be obtained for this instrument are close to the optimal form. The objective of the current research is the experimental validation of this instrument. Here, we present the first results for determining the instrumental matrix and the demodulation results for a s eries of polarization states. In conclusion, we present the possible further developments of that project.
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During the last few years, one of our main research topics has been developing a new type of spectropolarimeter intended for space applications. Initially analyzed numerically, the instrument has a compact, stable design without rotating components. The entire Stokes vector can be determined in a single shot in a vast spectral range. The simulations proved that the modulation schemes that can be obtained for this instrument are close to the optimal form. The objective of the current research is the experimental validation of this instrument. Here, we present the first results for determining the instrumental matrix and the demodulation results for a s eries of polarization states. In conclusion, we present the possible further developments of that project.
Reflectance spectroscopy is a technique widely used to investigate the composition and physical properties of a surface. The spectro-polarimetry adds the investigation of the polarimetric state of the light, while keeping the spectroscopy dependency. This technique is currently limited for the characterization of the surface, but can bring another clue on the composition and physical properties of the studied surface. We present here the design of a novel ellipsometer, optimized for the investigation of the polarization state of the light reflected by a granular surface. This instrument is able to measure the linear and circular components of the polarization over a wide spectral range from the ultraviolet to near-infrared and at a wide choice of geometrical configuration. The wide spectral range is achieved with the use of a photoelastic modulator acting like a retardance waveplate over the whole working range. Spectro-polarimetric investigations of terrestrial and extra-terrestrial samples will have application to mineralogical investigations, planetary surface explorations, and improve our understanding of the Solar System.
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Reflectance spectroscopy is a technique widely used to investigate the composition and physical properties of a surface. The spectro-polarimetry adds the investigation of the polarimetric state of the light, while keeping the spectroscopy dependency. This technique is currently limited for the characterization of the surface, but can bring another clue on the composition and physical properties of the studied surface. We present here the design of a novel ellipsometer, optimized for the investigation of the polarization state of the light reflected by a granular surface. This instrument is able to measure the linear and circular components of the polarization over a wide spectral range from the ultraviolet to near-infrared and at a wide choice of geometrical configuration. The wide spectral range is achieved with the use of a photoelastic modulator acting like a retardance waveplate over the whole working range. Spectro-polarimetric investigations of terrestrial and extra-terrestrial samples will have application to mineralogical investigations, planetary surface explorations, and improve our understanding of the Solar System.