Non-intrusive near-field characterization of distributed effects in large-periphery LDMOS RF power transistors
Conference Paper
(2015)
Author(s)
Rui Hou (TU Delft - Electronics)
M. Spirito (TU Delft - Electronics)
R Heeres (External organisation)
F. van Rijs (External organisation)
Leonardus Cornelis Nicolaas de Vreede (TU Delft - Old - EWI Ch. Integrated Sensing Devices, TU Delft - Electronics)
Research Group
Electronics
DOI related publication
https://doi.org/10.1109/MWSYM.2015.7166945
To reference this document use:
https://resolver.tudelft.nl/uuid:4da288e8-63e9-4a09-925a-e3225585d523
More Info
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Publication Year
2015
Language
English
Research Group
Electronics
Pages (from-to)
1-3
ISBN (print)
978-147998275-2
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