The Last Line Effect
Moritz Beller (TU Delft - Software Engineering)
Andy Zaidman (TU Delft - Software Engineering)
Andrey Karpov (OOO 'Program Verification Systems')
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Abstract
Micro-clones are tiny duplicated pieces of code, they typically comprise only a few statements or lines. In this paper, we expose the "last line effect," the phenomenon that the last line or statement in a micro-clone is much more likely to contain an error than the previous lines or statements. We do this by analyzing 208 open source projects and reporting on 202 faulty micro-clones.