The Last Line Effect

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The Last Line Effect

Conference Paper (2015)

Author(s)

Moritz Beller (TU Delft - Software Engineering)

Andy Zaidman (TU Delft - Software Engineering)

Andrey Karpov (OOO 'Program Verification Systems')

Defects Code Clones Last Line Effect Last Statement Effect Micro-clone

DOI related publication

https://doi.org/10.1109/ICPC.2015.34 Final published version

To reference this document use

https://resolver.tudelft.nl/uuid:4daa54da-8752-4529-aa37-ee757026472e

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Publication Year

2015

Language

English

Volume number

2015-August

Article number

7181452

Pages (from-to)

240-243

ISBN (electronic)

978-14673-8159-8

Event

23rd IEEE International Conference on Program Comprehension, ICPC 2015 (2015-05-18 - 2015-05-19), Florence, Italy

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Abstract

Micro-clones are tiny duplicated pieces of code, they typically comprise only a few statements or lines. In this paper, we expose the "last line effect," the phenomenon that the last line or statement in a micro-clone is much more likely to contain an error than the previous lines or statements. We do this by analyzing 208 open source projects and reporting on 202 faulty micro-clones.

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