The Last Line Effect

Conference paper (2015)

Authors

M.M. Beller Software Engineering - EEMCS
A.E. Zaidman Software Engineering - EEMCS
Andrey Karpov OOO 'Program Verification Systems'
Research Group
Software Engineering (EEMCS) (TU Delft)
Copyright: © 2015 M.M. Beller, A.E. Zaidman, Andrey Karpov
DOI
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https://doi.org/10.1109/ICPC.2015.34
Defects Code Clones Last Line Effect Last Statement Effect Micro-clone
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Published Date

2015

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Software Technology

Research Group

Software Engineering

Abstract

Micro-clones are tiny duplicated pieces of code, they typically comprise only a few statements or lines. In this paper, we expose the "last line effect," the phenomenon that the last line or statement in a micro-clone is much more likely to contain an error than the previous lines or statements. We do this by analyzing 208 open source projects and reporting on 202 faulty micro-clones.

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