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Aging Characteristics of FR-4 at Different Frequencies

Conference Paper (2025)
Author(s)

W. Zhao (TU Delft - High Voltage Technology Group)

M. Ghaffarian Niasar (TU Delft - High Voltage Technology Group)

Research Group
High Voltage Technology Group
DOI related publication
https://doi.org/10.1109/CEIDP61707.2025.11218593
More Info
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Publication Year
2025
Language
English
Research Group
High Voltage Technology Group
Bibliographical Note
Green Open Access added to TU Delft Institutional Repository as part of the Taverne amendment. More information about this copyright law amendment can be found at https://www.openaccess.nl. Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.@en
Pages (from-to)
129-132
ISBN (print)
979-8-3315-8903-5
ISBN (electronic)
979-8-3315-8902-8
Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Abstract

PCB transformers are emerging as a promising alternative to medium-frequency wire-wound transformers due to their numerous advantages. However, research on FR-4, the primary PCB insulation material, remains limited. This study investigates the dielectric performance of PCB electrodes through interlayer breakdown tests at 50 Hz, yielding an aging curve for this condition. Additionally, layer-to-layer breakdown tests were conducted at 50 Hz and 1 kHz, revealing a reduction in time to breakdown with increasing frequency. Notably, interlayer breakdown is significantly more likely, exhibiting a breakdown strength eight times lower than that of layer-to-layer breakdown.

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