Experimental characterization of roughness induced scattering losses in PECVD SiC waveguides
Journal Article
(2011)
Author(s)
Grégory Pandraud (TU Delft - Electronic Components, Technology and Materials)
E Margallo-Balbás (External organisation)
CK Yang (TU Delft - Electronic Instrumentation)
P. J. French (TU Delft - Electronic Instrumentation)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/JLT.2011.2108264
To reference this document use:
https://resolver.tudelft.nl/uuid:4e5b2c0d-2c58-4619-8881-0ab5664aa8c7
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Publication Year
2011
Language
English
Research Group
Electronic Components, Technology and Materials
Issue number
5
Volume number
29
Pages (from-to)
744-749
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