A study of reactive ion etching damage effects in GaN
Journal Article
(2001)
Author(s)
B Rong (TU Delft - QN/Kavli Nanolab Delft)
RJ Reeves (External organisation)
SA Brown (External organisation)
MM Alkaisi (External organisation)
EWJM van der Drift (TU Delft - QN/Kavli Nanolab Delft)
R Cheung (External organisation)
Research Group
QN/Kavli Nanolab Delft
To reference this document use:
https://resolver.tudelft.nl/uuid:54321756-10d6-4a6d-8d56-7fbddc6d3510
More Info
expand_more
expand_more
Publication Year
2001
Research Group
QN/Kavli Nanolab Delft
Volume number
57-58
Pages (from-to)
585-595
No files available
Metadata only record. There are no files for this record.