An industrial evaluation of DRAM tests
Journal Article
(2004)
Author(s)
AJ van de Goor (TU Delft - Computer Engineering)
Research Group
Computer Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:55e6b9d6-d7d4-46ed-b121-26c57e3c81b1
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Publication Year
2004
Research Group
Computer Engineering
Issue number
5
Volume number
21
Pages (from-to)
430-440
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