Test point insertion to improve BIST performance and to reduce ATPG test time and data volume
Doctoral Thesis
(2003)
Author(s)
MJ Geuzebroek (TU Delft - Computer Engineering)
Research Group
Computer Engineering
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https://resolver.tudelft.nl/uuid:56807fae-1f36-4275-b20e-f741ab33db59
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Publication Year
2003
Research Group
Computer Engineering
ISBN (print)
90-407-2412-1
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