Test point insertion to improve BIST performance and to reduce ATPG test time and data volume

TPI for improving PR fault coverage of Boolean and three-state circuits

Test point insertion that facilitates ATPG in reducing test time and data volume

Facilitating automatic test pattern generators using test point insertion

Logic BIST technology evaluation: an industrial case study

Test point insertion for compact test sets

Application of Transient Heat Flux Sensors to Resolve Time-Dependent Convective Heat Transfer from Wall-mounted Cubes