Test point insertion that facilitates ATPG in reducing test time and data volume

Conference paper (2002)

Authors

MJ Geuzebroek Computer Engineering - EEMCS
JT van Linden Computer Engineering - EEMCS
AJ van de Goor Computer Engineering - EEMCS
Research Group
Computer Engineering (EEMCS) (TU Delft)
Elektrotechniek Techniek
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Published Date

2002

Language

Undefined/Unknown

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering