Test point insertion that facilitates ATPG in reducing test time and data volume
Conference Paper
(2002)
Author(s)
MJ Geuzebroek (TU Delft - Computer Engineering)
JT van Linden (TU Delft - Computer Engineering)
AJ van de Goor (TU Delft - Computer Engineering)
Research Group
Computer Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:89ff3d76-b930-482e-aabb-9fb416c1bef8
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Publication Year
2002
Research Group
Computer Engineering
Pages (from-to)
138-148
ISBN (print)
0-7803-7542-4
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