TPI for improving PR fault coverage of Boolean and three-state circuits

Test point insertion to improve BIST performance and to reduce ATPG test time and data volume

Test point insertion that facilitates ATPG in reducing test time and data volume

Logic BIST technology evaluation: an industrial case study

Facilitating automatic test pattern generators using test point insertion

Test point insertion for compact test sets

Application of Transient Heat Flux Sensors to Resolve Time-Dependent Convective Heat Transfer from Wall-mounted Cubes