A BJT-based temperature sensor with a packaging-robust inaccuracy of ±0.3°C (3s) from -55°C to +125°C after heater-assisted voltage calibration

Conference Paper (2017)
Author(s)

B Yousefzadeh (TU Delft - Electronic Instrumentation)

Kofi AA Makinwa (TU Delft - Microelectronics)

Research Group
Electronic Instrumentation
DOI related publication
https://doi.org/10.1109/ISSCC.2017.7870311
More Info
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Publication Year
2017
Language
English
Research Group
Electronic Instrumentation
Volume number
60
Pages (from-to)
162-163
ISBN (print)
978-1-5090-3757-5
ISBN (electronic)
978-1-5090-3758-2

Abstract

This paper presents a BJT-based temperature sensor, which can be accurately trimmed in both ceramic and plastic packages, on the basis of purely electrical measurements at room temperature. This is achieved by combining the voltage-calibration technique from [1] with an on-chip heater, which can heat the sensing BJTs from room temperature to ∼85°C in 0.5s. Measurements show that the sensor can then be trimmed to an inaccuracy of ±0.3°C (3σ) over the military range (-55 to +125°C). This is similar to the inaccuracy obtained after conventional temperature calibration, i.e., at well-defined temperatures, but requires much less calibration time and infrastructure.

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