Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test
Jianlin Huang (TU Delft - Electrical Engineering, Mathematics and Computer Science)
Dušan S. Golubović (Lumileds Commercial (Shanghai) Co., Ltd)
Sau Koh (TU Delft - Beijing Delft Institute of Intelligent Science and Technology)
Xiupeng Li (Philips Lighting)
Xuejun Fan (Lamar University)
Guo Qi Zhang (TU Delft - Electrical Engineering, Mathematics and Computer Science)
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Abstract
In this paper, lumen degradation is described by using a modified Brownian motion process for mid-power white-light LED packages, which were aged under step stress accelerated degradation test (SSADT). First, a SSADT model has been established based on the theory of equivalent accumulative damage. Then, a method was proposed to improve the accuracy of the parameter estimation by carefully modifying the estimator, which was proposed in the previous research. Experimental data show that parameters estimated by using SSADT model are very close to those estimated by using constant stress accelerated degradation test (CSADT) model, indicating the feasibility of the SSADT model. The experiment also indicates that SSADT can be used as an alternative to CSADT, as it enables comparable estimation accuracy, while using less testing time, a smaller sample size and less test capacity.