Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test

Journal Article (2016)
Author(s)

J. L. Huang (TU Delft - Electronic Components, Technology and Materials)

Dušan S. Golubović (Lumileds Commercial (Shanghai) Co., Ltd)

S.W. Koh (TU Delft - Beijing Delft Institute of Intelligent Science and Technology)

X.P. Li (Philips Lighting)

Xue-Jun Fan (Lamar University)

Guo-Qi Zhang (TU Delft - Electronic Components, Technology and Materials)

Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1016/j.ress.2016.06.002
More Info
expand_more
Publication Year
2016
Language
English
Research Group
Electronic Components, Technology and Materials
Volume number
154
Pages (from-to)
152-159

Abstract

In this paper, lumen degradation is described by using a modified Brownian motion process for mid-power white-light LED packages, which were aged under step stress accelerated degradation test (SSADT). First, a SSADT model has been established based on the theory of equivalent accumulative damage. Then, a method was proposed to improve the accuracy of the parameter estimation by carefully modifying the estimator, which was proposed in the previous research. Experimental data show that parameters estimated by using SSADT model are very close to those estimated by using constant stress accelerated degradation test (CSADT) model, indicating the feasibility of the SSADT model. The experiment also indicates that SSADT can be used as an alternative to CSADT, as it enables comparable estimation accuracy, while using less testing time, a smaller sample size and less test capacity.

No files available

Metadata only record. There are no files for this record.