Scale-dependency of Thomsen parameters for layers with intermediate thickness
Conference Paper
(2002)
Author(s)
F Verhelst (ImPhys/Acoustical Wavefield Imaging )
Kees Wapenaar (TU Delft - Old - CITG Sect. Applied Geophysics and Petrophysics (<2005))
To reference this document use:
https://resolver.tudelft.nl/uuid:59ffa102-219d-49a6-9243-e95c4dfef3bb
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Publication Year
2002
Pages (from-to)
1947-1950
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