Application industrielle de l' iTIRM pour visualiser et mesurer la qualité de surface lors de la fabrication de composants optique de haute qualité.

Conference Paper (2000)
Author(s)

RM van der Bijl (External organisation)

OW Fähnle (TU Delft - ImPhys/Optics)

H van Brug (TU Delft - ImPhys/Optics)

S Debruyne (External organisation)

JJM Braat (TU Delft - ImPhys/Optics)

Research Group
ImPhys/Optics
More Info
expand_more
Publication Year
2000
Research Group
ImPhys/Optics
Pages (from-to)
-

No files available

Metadata only record. There are no files for this record.