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iTIRM, a nondestructive measuring technique to monitor surface quality during grinding and polishing.

Conference paper - RM van der Bijl, OW Fähnle, H van Brug, J.J.M. Braat

Quantitative surface characterization using a Normarki microscope.

Conference paper - OW Fähnle, S Debruyne, T Wons, RM van der Bijl, H van Brug, J.J.M. Braat

In situ Messmethode zum Monitoren der Qualitat optischer Oberflachen wahrend des Polierens auf der Maschine und Ihre Anwendung zum Klassifizieren von Polierprozessen

Book chapter - OW Faehnle, T Wons, E Koch, S. Debruyne-Fisba, SM Booij, M Meeder, H van Brug, J.J.M. Braat

Holographic simultaneous readout polarization multiplexing based on photoinduced anisotropy in bacteriorhodopsin

Journal article - W.D. Koek, N. Bhattacharya, J.J.M. Braat, VSS Chan, J. Westerweel

Use of waveguides in sub-wavelength detection

Conference paper - JCJ de Langen, S Musa, S.F. Pereira, J.J.M. Braat

Options for super-high density optical recording.

Conference paper - J.J.M. Braat

Single-mode optical fibers in nulling interferometry: Chromaticity and longitudinal polarization issues.

Conference paper - JFP Spronck, S.F. Pereira, J.J.M. Braat

Estimating resist parameters in optical lithograpgy using the extended Nijboer-Zernike theory

Journal article - P. Dirksen, J.J.M. Braat, AJEM Janssen

Nulling interferometry without achromatic phase shifters: Latest results.

Journal article - JFP Spronck, S.F. Pereira, J.J.M. Braat

Calculations of the field distribution in the focal region for a multi-layer system

Conference paper - A.S. van de Nes, S.F. Pereira, J.J.M. Braat

Optical system optimization based on the network structure of local minima

Conference paper - A Serebriakov, F. Bociort, J.J.M. Braat

Energy and angular momentum flux in a high-numerical-aperture imaging system using the extended Nijboer-Zernike theory.

Journal article - S. van Haver, J.J.M. Braat, A.J.E.M. Jansen, P. Dirksen

Extreme UV Lithography, A candidate for next-generation lithography.

Conference paper - J.J.M. Braat

Quantitative roughness measurements with iTIRM.

Conference paper - RM van der Bijl, OW Fähnle, H van Brug, J.J.M. Braat

Chapter: Optical Design and Fabrication

Book chapter - J.J.M. Braat

High-NA aberration retrieval with extended Nijboer-Zernike vector diffraction theory: Erratum

Journal article - S. van Haver, J.J.M. Braat, P. Dirksen, AJEM Janssen

Rigorous Mask-imaging using the extended Nijboer-Zernike diffraction theory.

Poster - S. van Haver, J.J.M. Braat, S.F. Pereira

Multiplexing in high-density optical data storage using the orbital angular momentum of light beams.

Journal article - RJ Voogd, J.J.M. Braat

High-density optical data storage

Book chapter - A.S. van de Nes, J.J.M. Braat, S.F. Pereira

Optimizing multilayer coatings for extreme UV projection systems

Conference paper - MF Bal, M Singh, J.J.M. Braat

J.J.M. Braat

Authored