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Numerical analysis of aslit-groove diffrection problem

Journal article - P Lalanne, M Besbes, S Helfert, M. Sukharev, T. Seideman, F. Baiba, B Guizal, D van Labeke, JP Hugonin, S. van Haver, O.T.A. Janssen, A.M. Nugrowati, S.F. Pereira, Paul Urbach, A.S. van de Nes, A Moreau

Characterization of a novel mask imaging algorithm based on the Extended Nijboer Zernike (ENZ) formalism.

Poster - S. van Haver, O.T.A. Janssen, J.J.M. Braat, S.F. Pereira

Energy and angular momentum flux in a high-numerical-aperture imaging system using the extended Nijboer-Zernike theory.

Journal article - S. van Haver, J.J.M. Braat, A.J.E.M. Jansen, P. Dirksen

High-NA aberration retrieval with extended Nijboer-Zernike vector diffraction theory: Erratum

Journal article - S. van Haver, J.J.M. Braat, P. Dirksen, AJEM Janssen

Rigorous Mask-imaging using the extended Nijboer-Zernike diffraction theory.

Poster - S. van Haver, J.J.M. Braat, S.F. Pereira

Truncation of the Series expressions in the advanced ENZ-Theory of diffraction integrals

Journal article - S. van Haver, AJEM Janssen

Enabling efficient multilayer Optimization Based on the extended Nijboer-Zernike (ENZ) Imaging Algorithm.

Conference paper - S. van Haver, J.J.M. Braat, S.F. Pereira

Rigorous Mask-imaging using the extended Nijboer-Zernike diffraction theory.

Poster - S. van Haver, J.J.M. Braat, S.F. Pereira

Characterization of a novel mask imaging algorithm based on the Extended Nijboer-Zernike (ENZ) formalism.

Poster - S. van Haver, O.T.A. Janssen, AJEM Janssen, J.J.M. Braat, S.F. Pereira, P Evanschitzky

Extended Nijboer-Zernike (ENZ) based evaluation of amplitude and phase aberrations on scaled and annual pupils.

Conference paper - S. van Haver, AJEM Janssen, P. Dirksen, J.J.M. Braat

Image simulations of extended objects using an algorithm based on the Extended Nijboer Zernike (ENZ) formalism

Poster - S. van Haver, O.T.A. Janssen, AJEM Janssen, J.J.M. Braat, S.F. Pereira

Advanced analytic treatment and efficient computation of the diffraction integrals in the extended Nijboer-Zernike theory

Journal article - S. van Haver, AJEM Janssen

Vectorial aerial-image computations of three-dimensional objects based on the extended Nijboer-Zernike theory

Journal article - S. van Haver, J.J.M. Braat, AJEM Janssen, O.T.A. Janssen, S.F. Pereira

High-NA aberration retrieval with the extended Nijboer-Zernike vector diffraction theory.

Journal article - S. van Haver, J.J.M. Braat, P. Dirksen, AJEM Janssen

Assessment of optical systems by means of point-spread functions.

Book chapter - J.J.M. Braat, S. van Haver, AJEM Janssen, P. Dirksen

Strehl ratio and optimum focus of high-numerical-aperture beams.

Journal article - AJEM Janssen, S. van Haver, J.J.M. Braat, P. Dirksen

High-NA lens characterization by through-focus intensity measurement

Conference paper - S. van Haver, J.J.M. Braat, P. Dirksen, AJEM Janssen

On the modeling of Optical Systems containing elements of different scales

Journal article - Paul Urbach, O.T.A. Janssen, S. van Haver, A.J.H. Wachters

Extended Nijboer-Zernike (ENZ) based mask imaging: efficient coupling of electromagnetic field solvers and the ENZ imaging algorithm

Journal article - O.T.A. Janssen, S. van Haver, AJEM Janssen, J.J.M. Braat, Paul Urbach, S.F. Pereira

Image formation in a multilayer using the Extended Nijboer-Zernike theory

Journal article - J.J.M. Braat, S. van Haver, AJEM Janssen, S.F. Pereira

S. van Haver

Authored

Numerical analysis of aslit-groove diffrection problem

Characterization of a novel mask imaging algorithm based on the Extended Nijboer Zernike (ENZ) formalism.

Energy and angular momentum flux in a high-numerical-aperture imaging system using the extended Nijboer-Zernike theory.

High-NA aberration retrieval with extended Nijboer-Zernike vector diffraction theory: Erratum

Rigorous Mask-imaging using the extended Nijboer-Zernike diffraction theory.

Truncation of the Series expressions in the advanced ENZ-Theory of diffraction integrals

Enabling efficient multilayer Optimization Based on the extended Nijboer-Zernike (ENZ) Imaging Algorithm.

Rigorous Mask-imaging using the extended Nijboer-Zernike diffraction theory.

Characterization of a novel mask imaging algorithm based on the Extended Nijboer-Zernike (ENZ) formalism.

Extended Nijboer-Zernike (ENZ) based evaluation of amplitude and phase aberrations on scaled and annual pupils.

Image simulations of extended objects using an algorithm based on the Extended Nijboer Zernike (ENZ) formalism

Advanced analytic treatment and efficient computation of the diffraction integrals in the extended Nijboer-Zernike theory

Vectorial aerial-image computations of three-dimensional objects based on the extended Nijboer-Zernike theory

High-NA aberration retrieval with the extended Nijboer-Zernike vector diffraction theory.

Assessment of optical systems by means of point-spread functions.

Strehl ratio and optimum focus of high-numerical-aperture beams.

High-NA lens characterization by through-focus intensity measurement

On the modeling of Optical Systems containing elements of different scales

Extended Nijboer-Zernike (ENZ) based mask imaging: efficient coupling of electromagnetic field solvers and the ENZ imaging algorithm

Image formation in a multilayer using the Extended Nijboer-Zernike theory