Positron beam analysis of structurally ordered porosity in mesoporous silica thin films

van Veen, A; Escobar Galindo, R; Schut, Henk; Eijt, Stephan W H; Falub, CV; Balkenende, AR; de Theije, F.K.

Positron beam analysis of structurally ordered porosity in mesoporous silica thin films

Journal article (2003)

Authors

A van Veen Old - Section Defects in Materials

R Escobar Galindo Old - Section Defects in Materials

Henk Schut Old - Section Defects in Materials

Stephan W H Eijt Old - Section Defects in Materials

CV Falub Old - Section Defects in Materials

AR Balkenende External organisation

F.K. de Theije External organisation

Research Group

Old - Section Defects in Materials

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Published Date

2003

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Research Group

Old - Section Defects in Materials

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