Titanium nitride (TiN) as a gate material in BiCMOS devices for biomedical implants
Conference Paper
(2013)
Author(s)
N.S. Lawand (TU Delft - Electronic Instrumentation)
Henk van Zeijl (TU Delft - Electronic Components, Technology and Materials)
P. J. French (TU Delft - Electronic Instrumentation)
JJ Briaire (External organisation)
JHM Frijns (External organisation)
Research Group
Electronic Instrumentation
DOI related publication
https://doi.org/10.1109/ICSENS.2013.6688502
To reference this document use:
https://resolver.tudelft.nl/uuid:5b0c2cf9-7baa-487b-b50a-0b07786318c5
More Info
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Publication Year
2013
Language
English
Research Group
Electronic Instrumentation
Pages (from-to)
1-4
ISBN (print)
978-1-4673-4642-9
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