Efficient sensitivity based capacitance modeling for systematic and random geometric variations
Conference Paper
(2011)
Author(s)
Y Bi (TU Delft - Signal Processing Systems)
P Harpe (External organisation)
N.P. van der Meijs (TU Delft - Signal Processing Systems)
Research Group
Signal Processing Systems
DOI related publication
https://doi.org/10.1109/ASPDAC.2011.5722262
To reference this document use:
https://resolver.tudelft.nl/uuid:5cc3b2c2-7868-4c9a-b7f1-924bc452ae1c
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Publication Year
2011
Language
English
Research Group
Signal Processing Systems
Pages (from-to)
61-66
ISBN (print)
978-1-4244-7516-2
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