A Uni¿ed Aging Model of NBTI and HCI Degradation towards Lifetime Reliability Management for Nanoscale MOSFET Circuits
Conference Paper
(2011)
Author(s)
Y. Wang (TU Delft - Computer Engineering)
S. D. Cotofana (TU Delft - Computer Engineering)
Liang Fang (External organisation)
Research Group
Computer Engineering
DOI related publication
https://doi.org/10.1109/NANOARCH.2011.5941501
To reference this document use:
https://resolver.tudelft.nl/uuid:5dede29d-967b-40e9-990e-bc755614f37f
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Publication Year
2011
Language
English
Research Group
Computer Engineering
Pages (from-to)
175-180
ISBN (print)
978-1-4577-0995-1
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