PECVD SiC optical waveguide loss and mode characteristics

Journal article (2007)

Authors

G. Pandraud QN/High Resolution Electron Microscopy
HTM Pham Old - EWI Sect. ECTM
P.J. French Electronic Instrumentation - EEMCS
Pasqualina M Sarro Electronic Components, Technology and Materials - EEMCS
Research Group
QN/High Resolution Electron Microscopy
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Published Date

2007

Language

Undefined/Unknown

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Research Group

QN/High Resolution Electron Microscopy