Transition Fault Testing for Offline Adaptive Voltage Scaling
Poster
(2017)
Author(s)
Mahroo Zandrahimi (TU Delft - Computer Engineering)
Philippe Debaud (STMicroelectronics)
Armand Castillejo (STMicroelectronics)
Zaid Al-Ars (TU Delft - Computer Engineering)
Research Group
Computer Engineering
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https://resolver.tudelft.nl/uuid:5f993ac6-ec76-4eb0-950e-3ce6d9525276
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Publication Year
2017
Language
English
Research Group
Computer Engineering
Pages (from-to)
1-1
Event
The 48th International Test Conference (ITC) (2017-10-31 - 2017-11-02), Fort Worth, United States
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