Transition Fault Testing for Offline Adaptive Voltage Scaling

Poster (2017)
Author(s)

Mahroo Zandrahimi (TU Delft - Computer Engineering)

Philippe Debaud (STMicroelectronics)

Armand Castillejo (STMicroelectronics)

Zaid Al-Ars (TU Delft - Computer Engineering)

Research Group
Computer Engineering
More Info
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Publication Year
2017
Language
English
Research Group
Computer Engineering
Pages (from-to)
1-1
Event
The 48th International Test Conference (ITC) (2017-10-31 - 2017-11-02), Fort Worth, United States
Downloads counter
130

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