Simulation of twin boundary effect on characteristics of single-grain silicon thin film transistors
Journal Article
(2007)
Author(s)
B Yan (TU Delft - Electronic Components, Technology and Materials)
P Migliorato (External organisation)
Ryoichi Ishihara (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:6131efe5-2ed0-44a6-a88c-13bc4818344a
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Publication Year
2007
Research Group
Electronic Components, Technology and Materials
Volume number
91
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