Simulation of twin boundary effect on characteristics of single-grain silicon thin film transistors

Yan, B; Migliorato, P; Ishihara, R.

Simulation of twin boundary effect on characteristics of single-grain silicon thin film transistors

Journal article (2007)

Authors

B Yan Electronic Components, Technology and Materials

P Migliorato External organisation

R. Ishihara Electronic Components, Technology and Materials

Research Group

Electronic Components, Technology and Materials

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Published Date

2007

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Research Group

Electronic Components, Technology and Materials

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