Simulation of ion imaging: Sputtering, contrast, noise
Journal Article
(2011)
Author(s)
V Castaldo (TU Delft - ImPhys/Charged Particle Optics)
Cornelis W. Hagen (TU Delft - ImPhys/Charged Particle Optics)
Pieter Kruit (TU Delft - ImPhys/Charged Particle Optics)
Research Group
ImPhys/Charged Particle Optics
To reference this document use:
https://resolver.tudelft.nl/uuid:6163c578-8a8f-4276-873b-8a29e9f49915
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Publication Year
2011
Research Group
ImPhys/Charged Particle Optics
Volume number
111
Pages (from-to)
982-994
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