Characterization of the fabrication process of Nb/Al-AlNx/Nb tunnel junctions with low RnA values up to 1 omega mu m²
Journal Article
(2002)
Author(s)
N Iossad (TU Delft - QN/Fysics of NanoElectronics)
AB Ermakov (External organisation)
FE Meijer (TU Delft - QN/Fysics of NanoElectronics)
BD Jackson (TU Delft - QN/Fysics of NanoElectronics)
Teun M. Klapwijk (TU Delft - QN/Fysics of NanoElectronics)
Research Group
QN/Fysics of NanoElectronics
To reference this document use:
https://resolver.tudelft.nl/uuid:61853eca-1238-49e8-90d4-9099ea22f483
More Info
expand_more
expand_more
Publication Year
2002
Research Group
QN/Fysics of NanoElectronics
Issue number
6
Volume number
15
Pages (from-to)
945-951
No files available
Metadata only record. There are no files for this record.