Logical and topological testing of scrambled RAMs

Conference Paper (2003)

Author(s)

I Schanstra (External organisation)

AJ van de Goor (TU Delft - Computer Engineering)

Research Group

Computer Engineering

Elektrotechniek Techniek Conf.proc. > 3 pag

To reference this document use:

More Info

expand_more

Publication Year

2003

Research Group

Computer Engineering

Pages (from-to)

66-71

No files available

Metadata only record. There are no files for this record.