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Benchmarking Gate Fidelities in a Si/SiGe Two-Qubit Device

Journal Article (2019)
Author(s)

X. Xue (Kavli institute of nanoscience Delft, TU Delft - QCD/Vandersypen Lab, TU Delft - QuTech Advanced Research Centre)

T. F. Watson (Kavli institute of nanoscience Delft, TU Delft - QCD/Vandersypen Lab, TU Delft - QuTech Advanced Research Centre)

J. Helsen (TU Delft - QuTech Advanced Research Centre, TU Delft - Quantum Information and Software)

D. R. Ward (University of Wisconsin-Madison)

D. E. Savage (University of Wisconsin-Madison)

M. G. Lagally (University of Wisconsin-Madison)

S. N. Coppersmith (University of Wisconsin-Madison)

M. A. Eriksson (University of Wisconsin-Madison)

S. Wehner (TU Delft - Quantum Internet Division, TU Delft - Quantum Information and Software, TU Delft - QuTech Advanced Research Centre)

L. M.K. Vandersypen (TU Delft - QN/Vandersypen Lab, TU Delft - QuTech Advanced Research Centre, TU Delft - QCD/Vandersypen Lab, Kavli institute of nanoscience Delft)

Research Group
QCD/Vandersypen Lab
DOI related publication
https://doi.org/10.1103/PhysRevX.9.021011 Final published version
More Info
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Publication Year
2019
Language
English
Research Group
QCD/Vandersypen Lab
Issue number
2
Volume number
9
Article number
021011
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339
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Abstract

We report the first complete characterization of single-qubit and two-qubit gate fidelities in silicon-based spin qubits, including cross talk and error correlations between the two qubits. To do so, we use a combination of standard randomized benchmarking and a recently introduced method called character randomized benchmarking, which allows for more reliable estimates of the two-qubit fidelity in this system, here giving a 92% fidelity estimate for the controlled-Z gate. Interestingly, with character randomized benchmarking, the two-qubit gate fidelity can be obtained by studying the additional decay induced by interleaving the two-qubit gate in a reference sequence of single-qubit gates only. This work sets the stage for further improvements in all the relevant gate fidelities in silicon spin qubits beyond the error threshold for fault-tolerant quantum computation.