The use of Electronic Spechte Pattern Interferometry (ESPI).

Conference paper (2001)

Authors

H Botter Electrical Power Processing
? Wijen External organisation
A van den Berg Structural Integrity & Composites - Aerospace Engineering
F Soetens External organisation
IJJ van Straalen External organisation
A Vlot Structural Integrity & Composites - Aerospace Engineering
Research Group
Electrical Power Processing
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Published Date

2001

Language

Undefined/Unknown

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Research Group

Electrical Power Processing