The use of Electronic Spechte Pattern Interferometry (ESPI).

Botter, H; Wijen, ?; van den Berg, Albert; Soetens, F; van Straalen, IJJ; Vlot, A

The use of Electronic Spechte Pattern Interferometry (ESPI).

Conference paper (2001)

Authors

H Botter Electrical Power Processing

? Wijen External organisation

Albert van den Berg Structural Integrity & Composites

F Soetens External organisation

IJJ van Straalen External organisation

A Vlot Structural Integrity & Composites

Research Group

Electrical Power Processing

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Published Date

2001

Language

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Research Group

Electrical Power Processing

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