The use of Electronic Spechte Pattern Interferometry (ESPI).
Conference Paper
(2001)
Author(s)
H Botter (TU Delft - Electrical Power Processing)
? Wijen (External organisation)
Albert van den Berg (TU Delft - Structural Integrity & Composites)
F Soetens (External organisation)
IJJ van Straalen (External organisation)
A. Vlot (TU Delft - Structural Integrity & Composites)
Research Group
Electrical Power Processing
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Publication Year
2001
Research Group
Electrical Power Processing
Pages (from-to)
1-5
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