Generation-Recombination Noise: The Fundamental Sensitivity Limit for Kinetic Inductance Detectors

Journal article (2012)

Authors

P.J. de Visser QN/Fysics of NanoElectronics
JJA Baselmans External organisation
P Diener External organisation
A. Endo QN/Fysics of NanoElectronics
T.M. Klapwijk QN/Fysics of NanoElectronics
Research Group
QN/Fysics of NanoElectronics
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Published Date

2012

Language

English

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Research Group

QN/Fysics of NanoElectronics