Generation-Recombination Noise: The Fundamental Sensitivity Limit for Kinetic Inductance Detectors
Journal Article
(2012)
Author(s)
P. J. De Visser (TU Delft - QN/Fysics of NanoElectronics)
JJA Baselmans (External organisation)
P Diener (External organisation)
A Endo (TU Delft - QN/Fysics of NanoElectronics)
Teun Klapwijk (TU Delft - QN/Fysics of NanoElectronics)
Research Group
QN/Fysics of NanoElectronics
To reference this document use:
https://resolver.tudelft.nl/uuid:68b33c31-68c2-4446-af88-35e0199b3fa5
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Publication Year
2012
Language
English
Research Group
QN/Fysics of NanoElectronics
Issue number
3-4
Volume number
167
Pages (from-to)
335-340
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