Hydrogen diffusion through Ru thin films

Journal Article (2020)
Author(s)

O. Soroka (University of Twente)

J. M. Sturm (University of Twente)

C. J. Lee (Student TU Delft)

H. Schreuders (TU Delft - ChemE/Afdelingsbureau)

Bernard Dam (TU Delft - ChemE/Chemical Engineering)

F. Bijkerk (University of Twente)

Department
ChemE/Chemical Engineering
DOI related publication
https://doi.org/10.1016/j.ijhydene.2020.03.201
More Info
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Publication Year
2020
Language
English
Department
ChemE/Chemical Engineering
Issue number
29
Volume number
45
Pages (from-to)
15003-15010

Abstract

In this paper, an experimental measurement of the diffusion constant of hydrogen in ruthenium is presented. By using a hydrogen indicative Y layer, placed under the Ru layer, the hydrogen flux through Ru was obtained by measuring the optical changes in the Y layer. We use optical transmission measurements to obtain the hydrogenation rate of Y in a temperature range from room temperature to 100 °C. We show that the measured hydrogenation rate is limited mainly by the hydrogen diffusion in Ru. These measurements were used to estimate the diffusion coefficient, D, and activation energy of hydrogen diffusion in Ru thin films to be D = 5.9 × 10−14 m2/s ∙ exp (-0.33 eV/kBτ), with kB the Boltzmann constant and τ the temperature.

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