Detection of thermal runaway and extraction of thermal resistance in silicon-on-glass NPN BJTs using the Vcb-Vbe voltage plane
Conference Paper
(2002)
Author(s)
V d'Alessandro (TU Delft - Electronic Components, Technology and Materials)
N Nenadovic (TU Delft - Electronic Components, Technology and Materials)
F Tamigi (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
Lis Nanver (TU Delft - Electronic Components, Technology and Materials)
H Schellevis (TU Delft - Electronic Components, Technology and Materials)
JW Slotboom (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
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https://resolver.tudelft.nl/uuid:6da4e7d1-d448-46bb-b54b-33705fdfcb63
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Publication Year
2002
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
22-29
ISBN (print)
90-73461-33-2
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