Stability characterization of high-sensitivity silicon-based EUV photodiodes in a detrimental industrial environment
Conference Paper
(2011)
Author(s)
L Shi (TU Delft - Electronic Instrumentation)
L. K. Nanver (TU Delft - Electronic Components, Technology and Materials)
Stoyan Nihtianova (TU Delft - Electronic Instrumentation)
Research Group
Electronic Instrumentation
DOI related publication
https://doi.org/10.1109/IECON.2011.6119729
To reference this document use:
https://resolver.tudelft.nl/uuid:72fcdf1d-02fd-4c77-b1fb-2b2510d3c339
More Info
expand_more
expand_more
Publication Year
2011
Language
English
Research Group
Electronic Instrumentation
Pages (from-to)
2651-2656
No files available
Metadata only record. There are no files for this record.