Interface roughness fractality effects on the electron mobility in semiconducting quantum wells
Journal Article
(1998)
Author(s)
G Palasantzas (TU Delft - Old organisation TN/TechnischeNatuurkunde voorm)
J Barnas (External organisation)
LJ Geerligs (TU Delft - QN/Fysics of NanoElectronics)
Department
Old organisation TN/TechnischeNatuurkunde voorm
To reference this document use:
https://resolver.tudelft.nl/uuid:76df467b-1288-40ca-8cfb-ceeb8e0c9be4
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Publication Year
1998
Department
Old organisation TN/TechnischeNatuurkunde voorm
Volume number
209
Pages (from-to)
319-327
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