Advanced scanning probes for micro-nano science researchers
Journal Article
(2010)
Author(s)
T Akiyama (External organisation)
S. Gautsch (External organisation)
D Parrat (External organisation)
R Imer (External organisation)
P Vettiger (External organisation)
U. Staufer (TU Delft - Micro and Nano Engineering)
NF de Rooij (External organisation)
Research Group
Micro and Nano Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:77f16e2d-07e6-48bc-a6be-592da86818b3
More Info
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Publication Year
2010
Language
English
Research Group
Micro and Nano Engineering
Volume number
5
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