Development of a scanning probe ion mass spectrometer.

Conference paper (1999)

Authors

NN Gribov External organisation
P.F.A. Alkemade Old - sect Electronic Materials (NS/EM)
S Radelaar OLD Metals Processing, Microstructures and Properties
Research Group
Old - sect Electronic Materials (NS/EM)
More Info
expand_more

Published Date

1999

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

Old - sect Electronic Materials (NS/EM)