A study of the reliability of passivation layers for sensor applications
Conference Paper
(1999)
Author(s)
P.J. Trimp (TU Delft - Electronic Instrumentation)
JR Mollinger (TU Delft - Electronic Instrumentation)
A. Bossche (TU Delft - Electronic Instrumentation)
FR Riedijk (TU Delft - Electronic Instrumentation)
Patrick J. French (TU Delft - Electronic Instrumentation)
Research Group
Electronic Instrumentation
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https://resolver.tudelft.nl/uuid:7e950acb-07e2-4c30-a2c6-7bdc4eceee8c
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Publication Year
1999
Research Group
Electronic Instrumentation
Pages (from-to)
823-826
ISBN (print)
90-76699-02-X
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