Verification of the simultaneous local extraction method of base and thermal resistance of bipolar transistors

Journal article (2014)

Authors

R. Setekera Electronic Components, Technology and Materials - EEMCS
LF Tiemeijer External organisation
R. van der Toorn Electronic Components, Technology and Materials - EEMCS , Mathematical Physics - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2014

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials