Verification of the simultaneous local extraction method of base and thermal resistance of bipolar transistors
Journal Article
(2014)
Author(s)
R Setekera (TU Delft - Electronic Components, Technology and Materials)
LF Tiemeijer (External organisation)
Ramses van der Toorn (TU Delft - Mathematical Physics, TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:807a01d9-a835-4d1b-85c2-30033c0919cd
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Publication Year
2014
Language
English
Research Group
Electronic Components, Technology and Materials
Issue number
10
Volume number
8
Pages (from-to)
1445-1449
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