Analysis of the local extraction method of base and thermal resistance of bipolar transistors
Conference Paper
(2014)
Author(s)
R Setekera (TU Delft - Electronic Components, Technology and Materials)
LF Tiemeijer (External organisation)
W Kloosterman (External organisation)
R van der Toorn (TU Delft - Mathematical Physics, TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/BCTM.2014.6981318
To reference this document use:
https://resolver.tudelft.nl/uuid:8088c21a-f4d3-414a-a5b1-9d158d21cf08
More Info
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Publication Year
2014
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
215-218
ISBN (print)
978-1-4799-7230-2
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